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ibm [2020/12/23 13:26] Michele GIUGLIANOibm [2020/12/23 13:26] Michele GIUGLIANO
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 **Relevant publications**  **Relevant publications** 
  
-  * Mensch, P.; Moselund, K.; Karg, S.; Lörtscher, E.; Björk, M. & Riel, H. +  * Mensch, P.; Moselund, K.; Karg, S.; Lörtscher, E.; Björk, M. & Riel, H. Interface State Density of Single Vertical Nanowire MOS Capacitors, IEEE Transactions on Nanotechnology, 2013, 12, 279 –282
- Interface State Density of Single Vertical Nanowire MOS Capacitors, IEEE Transactions on Nanotechnology, 2013, 12, 279 –282+
   * Moselund, K. E.; Schmid, H.; Bessire, C.; Björk, M. T.; Ghoneim, H. & Riel, H. InAs–Si Nanowire Heterojunction Tunnel FETs. IEEE Electron Device Letters, 2012, 33, 1453-1455     * Moselund, K. E.; Schmid, H.; Bessire, C.; Björk, M. T.; Ghoneim, H. & Riel, H. InAs–Si Nanowire Heterojunction Tunnel FETs. IEEE Electron Device Letters, 2012, 33, 1453-1455  
   * Wirths, S.; Mayer, B. F.; Schmid, H.; Sousa, M.; Gooth, J.; Riel, H. & Moselund, K. E. Room Temperature Lasing from Monolithically Integrated GaAs Microdisks on Si. ACS Nano, 2018, 12, 2169-2175    * Wirths, S.; Mayer, B. F.; Schmid, H.; Sousa, M.; Gooth, J.; Riel, H. & Moselund, K. E. Room Temperature Lasing from Monolithically Integrated GaAs Microdisks on Si. ACS Nano, 2018, 12, 2169-2175